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Failure Rate

Failure rate is the frequency with which a component fails, expressed for example in failures per hour. It is often denoted by the Greek letter (lambda). In practice, the reciprocal rate MTBF is more commonly expressed and used for high quality components.

FR is usually <>time dependent, and an intuitive corollary is that both rates change over time versus the expected life cycle of the component. For example, as a Cell Phone grows older, the failure rate in its third year of service may be many times greater than its failure rate during its first year of service. You don't expect to replace an LCD, replace a connector, or have major power failure in a new phone.

In those special cases when the likelihood of failure remains constant with respect to time (for example, in some product like a brick or protected steel beam), failure rate is simply the inverse of the mean time between failure (MTBF), expressed for example in hours per failure.

MTBF is an important specification parameter in all aspects of engineering design.

The Failures-In-Time (FIT) rate of a device is the number of failures that can be expected in one billion hours of operation. This term is used particularly by the semiconductor industry.

Failure-Rate can be defined as:

The TOTAL NUMBER of failures within an item population, divided by the TOTAL TIME expended by that population, during a particular measurement interval under stated conditions.

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To build any digital device there is but 3 logic FUNCTIONS needed:

AND

OR

NOT

ALL LOGIC CIRCUITS ARE COMBINATIONS OF THESE THREE FUNCTIONS!

There is but just ONE gate type needed to build any digital device. Known as NAND OR NOR, these two types are called "Universal Gates".

DeMorgan's Theorem....

You can swap shapes if at the same time you invert all inputs and outputs.

....Truth Table....

- AND GATE -

....A....B....AB

....0....0....0

....0....1....0

....1....0....0

....1....1....1

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Failure Rate Failure Rate